flag flag  

Perspectives for low noise detector readout in a sub-quarter-micron CMOS SOI technology

Description :
Language(s) : English
Subject(s) : microelectronics; CMOS; , Electrical & Electronics Engineering , Ingegneria industriale e dell'informazione
Publisher(s) : IEEE
Contributor(s) :
Source(s) :
Publication Date(s) : 2007-01-01