flag flag  

Single-crystal silicon nanoparticles: An instability to check their synthesis

Description : An instability occuring in electrical signals of the discharge is used as a mark to detect the end of the single-crystal silicon nanoparticle formation in Ar/SiH4 rf plasmas. Scanning electron microscopy and atomic force microscopy studies of depositions show that the exact beginning of the coalesce...
Language(s) : English
Subject(s) : [SPI:PLASMA] Engineering Sciences/Plasmas , [PHYS:PHYS:PHYS_PLASM-PH] Physics/Physics/Plasma Physics , Dusty plasma , Complex plasma , Dust particle , Nanoparticle , Silicon , Silane , Deposition , Nanostrutured materials , Electron microscopy , MEB , AFM , Nanocrystal
Publisher(s) :
Contributor(s) :
Source(s) : Applied Physics Letters
Publication Date(s) : 2006-01-01