flag flag  

Search all repositories
add criteria
Close advanced options Search for

 

Enter more search criteria
Publication Date
     
From
To
Document Language
Document Type
Repositories
Search History
• (author = "GAIONI, Luigi")
Document details

Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors

Author(s) : TRAVERSI, GIANLUCA , RE, VALERIO , RATTI, LODOVICO , GAIONI, LUIGI , MANGHISONI, MASSIMO
Description : The large scale of integration provided by CMOS processes with minimum feature size in the 100 nm range, makes them very attractive in the design of front-end electronics for highly pixelated detectors, where several functions need to be packed inside a relatively small silicon area. Nowadays, proce...
Repository : Aisberg - Archivio Istituzionale Università di Bergamo , View repository documents
Language(s) : English
Subject(s) : CMOS; microelectronics; scaling; sensors; , Electrical & Electronics Engineering , Ingegneria industriale e dell'informazione
Publisher(s) : Elsevier Science Limited
Contributor(s) :
Source(s) :
Publication Date(s) : 2010-01-01