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Investigating degradation mechanisms in 130nm and 90nm commercial CMOS technologies exposed to up to 100 Mrad ionizing radiation dose

Description :
Language(s) : English
Subject(s) : Ionizing radiation; deep submicron CMOS; thermal noise; flicker noise , Electrical & Electronics Engineering , Ingegneria industriale e dell'informazione
Publisher(s) : CEA
Contributor(s) :
Source(s) :
Publication Date(s) : 2007-01-01