flag flag  

Search all repositories
add criteria
Close advanced options Search for

 

Enter more search criteria
Publication Date
     
From
To
Document Language
Document Type
Repositories
Search History
• (author = "GAIONI, Luigi")
Document details

Forecasting noise and radiation hardness of CMOS front-end electronics beyond the 100 nm frontier

Author(s) : RE, VALERIO , GAIONI, LUIGI , MANGHISONI, MASSIMO , RATTI, LODOVICO , TRAVERSI, GIANLUCA
Description : The progress of industrial microelectronic technologies has already overtaken the 130 nm CMOS generation that is currently the focus of IC designers for new front-end chips in LHC upgrades and other detector applications. In a broader time span, sub-100 nm CMOS processes may become appealing for the...
Repository : Aisberg - Archivio Istituzionale Università di Bergamo , View repository documents
Language(s) : English
Subject(s) : CMOS; microelectronics; noise; sensors; , Electrical & Electronics Engineering , ING-INF/01 - Elettronica
Publisher(s) : Elsevier Science Limited
Contributor(s) :
Source(s) :
Publication Date(s) : 2010-01-01